Simulation-Based Assessment of Quantum Circuit Reliability

This report aims at presenting the research program and to review the literature describing quantum computing, quantum fault tolerance issues and classical fault injection. Thus, previous work is presented together with future research directions. The proposed PhD research program aims at developing a methodology for simulation based fault injection for quantum circuits. Through simulation, I obtain a statistically significant sample in order to provide a quantitative means to assess quantum circuit reliability. A desired feature of the fault injection methodology is scalability. Nevertheless, quantum circuit simulation requires simulation resources that grow exponentially with the number of simulated qubits. Although, simulation techniques that improve the simulation cost and/or time were developed, still for complex and large structures it is not feasible to apply fault injection. In order to overcome this obstacle and obtain scalability, I propose a logic partitioning. The complex and large quantum circuit is decomposed into less complex parts. Fault injection is used to evaluate quantum reliability for these parts. The reliability for the larger circuit is assessed by means of a reliability graph by taking into account the reliability of the smaller parts.